JPH02138844U - - Google Patents

Info

Publication number
JPH02138844U
JPH02138844U JP1679289U JP1679289U JPH02138844U JP H02138844 U JPH02138844 U JP H02138844U JP 1679289 U JP1679289 U JP 1679289U JP 1679289 U JP1679289 U JP 1679289U JP H02138844 U JPH02138844 U JP H02138844U
Authority
JP
Japan
Prior art keywords
sample introduction
introduction device
measurement chamber
preheating section
internal volume
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1679289U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1679289U priority Critical patent/JPH02138844U/ja
Publication of JPH02138844U publication Critical patent/JPH02138844U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Electron Tubes For Measurement (AREA)
JP1679289U 1988-12-26 1989-02-17 Pending JPH02138844U (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1679289U JPH02138844U (en]) 1988-12-26 1989-02-17

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP32628388 1988-12-26
JP1679289U JPH02138844U (en]) 1988-12-26 1989-02-17

Publications (1)

Publication Number Publication Date
JPH02138844U true JPH02138844U (en]) 1990-11-20

Family

ID=31717351

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1679289U Pending JPH02138844U (en]) 1988-12-26 1989-02-17

Country Status (1)

Country Link
JP (1) JPH02138844U (en])

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62132157A (ja) * 1985-12-04 1987-06-15 Hitachi Ltd 質量分析装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62132157A (ja) * 1985-12-04 1987-06-15 Hitachi Ltd 質量分析装置

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